Mother substrate, array test method thereof and display substrate
AssigneeSamsung Display Co., Ltd.
InventorsJi-Sun KIM, Chong-Chul CHAI, Yeong-Keun KWON
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Abstract
A mother substrate includes a display substrate cell defined by a scribe line, the display substrate cell including a plurality of gate lines, a gate circuit part driving the gate lines, and a gate pad part connected to the gate circuit part, a gate test pad part in a peripheral area surrounding the display substrate cell, the gate test pad part being configured to receive a gate test signal, a gate test line part connecting the gate test pad part and the gate pad part, and a switching part connected to the gate test line part and configured to control turning on and turning off of the gate test line part.
Claims20
A mother substrate, comprising:
- a display substrate cell defined by a scribe line, the display substrate cell including a plurality of gate lines, a gate circuit part driving the gate lines, and a gate pad part connected to the gate circuit part;
- a gate test pad part in a peripheral area surrounding the display substrate cell, the gate test pad part being configured to receive a gate test signal;
- a gate test line part connecting the gate test pad part and the gate pad part;
- and
- a switching part connected to the gate test line part and configured to control turning on and turning off of the gate test line part.
An array test method of a mother substrate for a display substrate cell having a plurality of data lines, a plurality of gate lines, a gate circuit part driving the gate lines and a gate pad part connected to the gate circuit part, the array test method comprising:
- turning on a gate test line part, which connects a gate pad part and a gate test pad part receiving a gate test signal, during an array test process of the display substrate cell;
- and
- turning off the gate test line part before and after the array test process.
A display substrate, comprising:
- a plurality of gate lines disposed in a display area;
- a plurality of data lines crossing the gate lines;
- a gate circuit part disposed in a peripheral area crossing the display area and configured to drive the gate lines;
- a gate pad part connected to the gate circuit part and configured to receive a gate driving signal;
- and
- a switching part disposed adjacent to the gate pad part and connected to the gate pad part.
Dependencies are inferred from the claim text.