Test socket which allows for ease of alignment
AssigneeIsc Co., Ltd.
InventorJae Hak Lee
Life of this patent
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AssigneeIsc Co., Ltd.
InventorJae Hak Lee
Estimating the term…
The present invention relates to a test socket which allows for ease of alignment, and more particularly, to a test socket that is interposed between a device to be inspected and an inspection apparatus so as to electrically connect terminals of the device to be inspected and pads of the inspection apparatus, the test socket including: an alignment member that has a plurality of through-holes formed at points corresponding to the terminals of the device to be inspected or the pads of the inspection apparatus and is attached to the inspection apparatus such that the through-holes are located at the pads of the inspection apparatus; and an elastic conductive sheet including conductive parts that are disposed at the points corresponding to the terminals of the device to be inspected and include a plurality of conductive particles that are distributed in an insulating elastic material, insulating support parts that support the conductive parts and disconnect an electrical connection between adjacent conductive parts, and protruding conductive parts that protrude downward from the conductive parts and are inserted into the plurality of through-holes of the alignment member, wherein when the protruding conductive parts are inserted into the through-holes of the alignment member, the elastic conductive sheet is aligned in the the alignment member.
A test socket that is interposed between a device to be inspected and an inspection apparatus so as to electrically connect terminals of the device to be inspected and pads of the inspection apparatus, the test socket comprising:
A test socket that is interposed between a device to be inspected and an inspection apparatus so as to electrically connect terminals of the device to be inspected and pads of the inspection apparatus, the test socket comprising:
Dependencies are inferred from the claim text.