Two port vector network analyzer using de-embed probes
AssigneeTektronix, Inc.
InventorsJohn J. Pickerd, Kan Tan, Daniel G. Knierim
Life of this patent
Estimating the term…
Abstract
A test and measurement system including a device under test, two de-embed probes connected to the device under test, and a test and measurement instrument connected to the two de-embed probes. The test and measurement instrument includes a processor configured to determine the S-parameter set of the device under test based on measurements from the device under test taken by the two de-embed probes.
Claims18
A method for determining an S-parameter set of a device under test using a test and measurement instrument, comprising:
- measuring an impedance of a signal generator with a first de-embed probe;
- measuring an input voltage to the device under test with the first de-embed probe connected to the input of the device under test;
- measuring an output voltage from the device under test with a second de-embed probe connected to the output of the device under test;
- measuring three loads of the device under test with the first de-embed probe connected to the input of the device under test and the second de-embed probe connected to the output of the device under test;
- and
- calculating the S-parameter set of the device under test based on the impedance of the signal generator, the input voltage to and the output voltage from the device under test, and the measured three loads of the device under test.
A test and measurement system for measuring an S-parameters set of a device under test, comprising:
- a signal generator;
- a first de-embed probe configured to measure an impedance of the signal generator and an input voltage of the device under test;
- a second de-embed probe configured to measure an output voltage of the device under test and an impedance of the device under test,
- wherein the first de-embed probe and the second de-embed probe are configured to measure at least three loads when both the first de-embed probe and the second de-embed probe are connected to the device under test;
- and
- a processor configured to calculate the S-parameter set of the device under test based on the impedance of the signal generator, the input voltage and the output voltage of the device under test, and the measured three loads of the device under test.
A test and measurement system, comprising:
- two de-embed probes configured to connect to a device under test and configured to take measurements of the device under test;
- and
- a processor configured to receive the measurements taken by the two de-embed probes and to determine the S-parameter set of the device under test based on the measurements of the device under test.
Dependencies are inferred from the claim text.