Current source driven measurement and modeling
AssigneeQUALCOMM Incorporated
InventorsYoung K. Song, Kyu-Pyung Hwang, Dong Wook Kim, Changhan Hobie Yun
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Abstract
A method and apparatus for testing integrated circuit resistors includes applying a variable source current to a resistive device under test (DUT), measuring the resistance of the resistive DUT as a function of the source current, and fitting the measured resistance to parameters of a polynomial parametric equation, wherein the parametric equation comprises a constant resistance at zero current bias plus a second order current coefficient of resistance multiplied by the square of the current.
Claims39
A method of testing integrated circuit resistors comprising:
- applying a variable source current to a resistive device under test (DUT);
- measuring the resistance of the resistive DUT as a function of the source current;
- and
- fitting the measured resistance to parameters of a polynomial parametric equation, wherein the parametric equation comprises a constant resistance at zero current bias plus a second order current coefficient of resistance times the square of the current.
An apparatus for testing integrated circuit resistors comprising:
- a variable current source coupled to a resistive device under test (DUT);
- a resistance measuring device to measure the resistance of the resistive DUT as a function of the source current;
- a parameter fitting device to determine coefficients of a polynomial parametric equation corresponding to the resistance of the resistive DUT as a function of current, wherein
- the parametric equation comprises a constant resistance at zero current bias plus a second order current coefficient of resistance multiplied by the square of the current.
A non-transitory computer readable media containing instructions which when executed by a processor cause the processor to perform the following steps:
- applying a variable source current to a resistive device under test (DUT);
- measuring the resistance of the resistive DUT as a function of the source current;
- and
- fitting the measured resistance to parameters of a polynomial parametric equation, wherein the parametric equation comprises a constant resistance at zero current bias plus a second order current coefficient of resistance multiplied by the square of the current.
An apparatus for testing integrated circuit resistors comprising:
- a variable current source coupled to a resistive device under test (DUT);
- means to measure the resistance of the resistive DUT as a function of the source current;
- means to determine coefficients of a polynomial parametric equation corresponding to the resistance of the resistive DUT as a function of current, wherein
- the parametric equation comprises a constant resistance at zero current bias added to a second order current coefficient of resistance multiplied by the square of the current.
Dependencies are inferred from the claim text.