Alternating current coupled electronic component test system and method
AssigneeIntel Corporation
InventorsBharani Thiruvengadam, Akira Kakizawa
Life of this patent
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Abstract
This disclosure relates generally to an electrical circuit and method. A capacitive element can be configured to be coupled in series with an electronic package component. A path resistance can be electrically coupled to the capacitive element. A driver can be configured to electrically charge the capacitive element. A voltage detector can be coupled to the capacitive element and configured to identify a condition of the electronic package component based on a measured voltage of the capacitive element.
Claims20
An electrical circuit, comprising:
- a capacitive element configured to be coupled in series with an electronic package component;
- a path resistance electrically coupled to the capacitive element;
- a driver configured to electrically charge the capacitive element;
- and
- a voltage detector coupled to the capacitive element and configured to identify a condition of the electronic package component based on a measured voltage of the capacitive element.
A method for determining a condition of an electronic package component, comprising:
- coupling a capacitive element in series with the electronic package component;
- coupling a path resistance to the capacitive element;
- electrically charging the capacitive element with a driver;
- and
- detecting, with a voltage detector, a time for a charge on the capacitive element as coupled in series with the electronic package component to decay to a predetermined threshold;
- and
- identifying the condition of the electronic package component based on the time as detected.
Dependencies are inferred from the claim text.