Magnetic measurement method and its system and apparatus
AssigneesToyota Jidosha Kabushiki Kaisha, Inter-University Research Institute Corporation High Energy Accelerator Research Organization
InventorsMasao YANO, Kanta ONO
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Abstract
The object of the present invention is to provide a method, system and apparatus that are capable of measuring magnetic characteristic of crystal grains composing magnetic polycrystalline materials in the magnetic field or nonmagnetic field by X-ray magnetic circular dichroism. In particular, the present invention is capable of measuring the magnetic characteristic of comparatively very thick materials.
Claims8
A magnetic measurement method comprising measuring magnetic characteristic of a sample of 50 nm˜1000 nm in thickness by irradiating the sample with X-ray, and detecting X-ray passing the sample.
Dependencies are inferred from the claim text.