Method and device for measuring unoccupied states of solid
AssigneeKyoto University
InventorHiroyuki Yoshida
Life of this patent
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Abstract
Intensity of near-ultraviolet light or visible light of 180 to 700 nm emitted from a solid sample, such as an organic semiconductor, irradiated with an electron beam is measured, while kinetic energy (accelerating energy) of the electron beam is changed in a range of 0 to 5 eV so as to obtain a spectrum. Peaks are detected from the spectrum, and the energy thereof is defined as unoccupied-states energy of the sample. The onset energy of the first peak represents electronic affinity energy (electron affinity) of the sample. Since the energy of the electron beam irradiated onto the sample is 5 eV or less, almost no damage is exerted on the sample even when the sample is an organic semiconductor.
Claims12
A method for measuring unoccupied states of a solid, comprising:
- a) a step of generating an electron beam;
- b) a step of changing kinetic energy of the generated electron beam within a range of 0 to 5 eV, and irradiating a solid sample with the electron beam;
- c) a step of measuring intensity of light of a predetermined wavelength within a range of 180 to 700 nm included in electromagnetic waves emitted from the solid sample;
- and
- d) a step of determining unoccupied-states energy of the solid sample based on a spectrum created by the intensity of light with respect to the kinetic energy of the electron beam.
A method for measuring unoccupied states of a solid, comprising:
- a) a step of generating an electron beam;
- b) a step of accelerating the generated electron beam with a predetermined energy within a range of 0 to 5 eV and irradiating a solid sample with the electron beam;
- c) a step of spectrally separating light within a range of 180 to 700 nm included in electromagnetic waves emitted from the solid sample, and measuring intensity of each wavelength to generate a spectrum;
- and
- d) a step of determining unoccupied-states energy of the solid sample based on the spectrum.
A device for measuring unoccupied states of a solid, comprising:
- a) an electron beam generator;
- b) an electron beam drive unit for changing kinetic energy of the electron beam generated by the electron beam generator within a range of 0 to 5 eV and irradiating a solid sample with the electron beam;
- c) a light intensity measuring unit for measuring intensity of light of a predetermined wavelength within a range of 180 to 700 nm included in electromagnetic waves emitted from the solid sample;
- and
- d) an unoccupied states determiner for determining unoccupied-states energy of the solid sample based on a spectrum created by the intensity of light with respect to the kinetic energy of the electron beam.
A device for measuring unoccupied states of a solid, comprising:
- a) an electron beam generator;
- b) an electron beam drive unit for accelerating an electron beam generated by the electron beam generator with a predetermined energy within a range of 0 to 5 eV and irradiating a solid sample with the electron beam;
- c) a spectrum generator for generating a spectrum by spectrally separating light within a range of 180 to 700 nm included in electromagnetic waves emitted from the solid sample and measuring intensity of the light as a function of wavelength;
- and
- d) an unoccupied states determiner for determining unoccupied-states energy of the solid sample based on the spectrum.
Dependencies are inferred from the claim text.