Nanowires and nanowire fielde-effect transistors
AssigneeSemiconductor Manufacturing International Corp.
InventorsDEYUAN XIAO, JAMES HONG
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Abstract
A method is provided for fabricating a nanowire-based semiconductor structure. The method includes forming a first nanowire with a first polygon-shaped cross-section having a first number of sides. The method also includes forming a semiconductor layer on surface of the first nanowire to form a second nanowire with a second polygon-shaped cross-section having a second number of sides, the second number being greater than the first number. Further, the method includes annealing the second nanowire to remove a substantial number of vertexes of the second polygon-shaped cross-section to form the nanowire with a non-polygon-shaped cross-section corresponding to the second polygon-shaped cross-section.
Claims22
1-12. (canceled)
A nanowire field-effect transistor, comprising:
- a first semiconductor substrate;
- a buried layer on the first semiconductor substrate;
- a nanowire suspended over the buried layer by a through-hole separating the nanowire from a top surface of the buried layer, wherein the nanowire comprises:
- a first nanowire deposited on the buried layer, the first nanowire comprising a first polygon-shaped cross-section having a first number of sides, and
- a semiconductor layer deposited on all exposed surface of the first nanowire, wherein the semiconductor layer has a second polygon-shaped cross-section containing the first polygon-shaped cross-section of the first nanowire, the second polygon-shaped cross-section having a second number of sides, the second number being greater than the first number of sides,
- wherein the nanowire is an annealed nanowire from annealing of the semiconductor layer and the first nanowire, to remove a substantial number of vertexes of the second polygon-shaped cross-section of the semiconductor layer, wherein the nanowire has a non-polygon-shaped cross-section corresponding to the second polygon-shaped cross-section;
- a gate structure covering the nanowire;
- and
- a source and a drain connecting with the nanowire and both disposed on the buried layer.
(canceled)
A nanowire field-effect transistor, comprising:
- a first semiconductor substrate;
- a buried layer on the first semiconductor substrate;
- a second semiconductor substrate on the buried layer, the second semiconductor substrate comprising a nanowire, a source, and a drain, the nanowire having one end connecting to the source and the other end connecting to the drain on the buried layer,
- wherein the nanowire comprises:
- a first nanowire deposited over the buried layer, the first nanowire comprising a first polygon-shaped cross-section having a first number of sides, and
- a semiconductor layer deposited on all exposed surface of the first nanowire, wherein the semiconductor layer has a second polygon-shaped cross-section containing the first polygon-shaped cross-section of the first nanowire, the second polygon-shaped cross-section having a second number of sides, the second number being greater than the first number of sides,
- wherein the nanowire is an annealed nanowire from annealing of the semiconductor layer and the first nanowire, to remove a substantial number of vertexes of the second polygon-shaped cross-section of the semiconductor layer, wherein the nanowire has a non-polygon-shaped cross-section corresponding to the second polygon-shaped cross-section;
- and
- a gate structure covering the nanowire.
Dependencies are inferred from the claim text.