System and method for decomposition of a single photoresist mask pattern into 3 photoresist mask patterns
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsWen-Li CHENG, Ming-Hui CHIH, Chia-Ping CHIANG, Ken-Hsien HSIEH, Tsong-Hua OU, Wen-Chun HUANG, Ru-Gun LIU
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