System for simultaneously determining memory test result

A system for simultaneously determining a memory test result result for physically distant memory devices in a pattern generator on a burn-in board, comprising:

• a pattern generation part for generating a pattern signal for testing to transmit the signal through an address line and a command line;
• a delay part for receiving through a first data line read data from a closest memory device and receiving through a second data line read data from a farthest memory device, the memory devices being mounted on the burn-in board;
• and
• a determination part for simultaneously testing the read data from the closest memory device and the read data from the farthest memory device, which are simultaneously output from the delay part, using one determination clock,
• wherein the delay part may recognize inputs of the read data from the closest memory device and the read data from the farthest memory device, and delay the output of the read data from the closest memory device by time difference of the inputs.