Back to results
US 2015/0033087 A1Published application
Resting blocks of memory cells in response to the blocks being deemed to fail
AssigneeMicron Technology, Inc.
InventorsTodd Marquart, Sampath Ratnam, Sean Eilert
Life of this patent
Estimating the term…
Abstract
In an embodiment, a block of memory cells is rested in response to the block of memory cells being deemed to fail. For some embodiments, a rested block may be selected for use in response to passing an operation. In other embodiments, a rested block may be rested again or may be permanently retired from further use in response to failing the operation.
Claims41
A method of operating a memory device, comprising:
- determining whether a block of memory cells is deemed to fail;
- and
- resting the block of memory cells in response to the block of memory cells being deemed to fail.
A method of operating a memory device, comprising:
- resting a block of memory cells in response to the block failing an operation;
- determining whether the rested block passes the operation;
- and
- selecting the rested block for use in response to passing the rested block passing the operation.
1 more element
A method of operating a memory device, comprising:
- resting a block of memory cells in response to a deemed failure of the block;
- testing the block after resting the block;
- designating the block as being useable in response to the block passing the test;
- and
- designating the block as being un-useable in response to the block not passing the test.
2 more elements
A memory device, comprising:
- a memory array comprising blocks of memory cells;
- and
- a controller;
- wherein the controller is configured to rest a block of memory cells in response to a deemed failure of the block of memory cells.
1 more element
A memory device, comprising:
- a memory array comprising blocks of memory cells;
- and
- a controller;
- wherein the controller is configured to rest a block of memory cells in response to the block of memory cells being deemed to fail an operation;
- wherein the controller is configured to determine whether the rested block of memory cells passes the operation;
- and
- wherein the controller is configured to select the rested block of memory cells for use in response to determining that the rested block of memory cells passes the operation.
4 more elements
A memory device, comprising:
- a memory array comprising blocks of memory cells;
- and
- a controller;
- wherein the controller is configured to rest a block of memory cells in response to a deemed failure of the block of memory cells;
- wherein the controller is configured to test the block of memory cells after resting the block of memory cells;
- wherein the controller is configured to designate the block of memory cells as being useable in response to the block of memory cells passing the test;
- and
- wherein the controller is configured to designate the block of memory cells as being un-useable block in response to the block of memory cells not passing the test.
5 more elements
Dependencies are inferred from the claim text.