Systems and methods mitigating temperature dependence of circuitry in electronic devices
AssigneeAnalog Test Engines
InventorJeffrey Allen King
Life of this patent
Estimating the term…
Abstract
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
Claims20
A method of using an electronic device, the device comprising a voltage measurement unit configured to generate a measurement value indicative of a voltage, wherein the measurement value is based partly on a temperature, the method comprising:
- applying a first voltage to the device;
- setting the temperature to each of multiple temperature values;
- storing a first plurality of measurement values indicative of the first voltage for the multiple temperature values;
- generating a first relationship, the first relationship being between the first measurement values and the temperature;
- generating a parameter for a compensation function based on the first relationship, wherein the compensation function is dependent on temperature, and wherein the compensation function is configured to be used to determine a compensated voltage value based on a test voltage which is measured at a measurement temperature and which is received by the voltage measurement unit;
- and
- storing the generated parameter.
An electronic device, comprising:
- a voltage measurement unit configured to sense a first voltage and to generate a measurement value indicative of a value of the sensed first voltage, wherein the measurement value is based partly on a temperature,
- a temperature sensor configured to sense the temperature;
- a processor configured to receive a temperature value based on the temperature sensed by the temperature sensor for each of multiple temperature values and to receive measurement values indicative of the first voltage sensed at each of the temperature values, wherein the processor is configured to generate a first relationship, the first relationship being between the received measurement values and the temperatures, and to generate one or more parameters for a compensation function based on the first relationship, wherein the compensation function is configured to be used to determine a compensated voltage value based on a test voltage which is measured at a measurement temperature and which is received by the voltage measurement unit;
- and
- a memory configured to store the one or more parameters.
A method of using an electronic device, the device comprising a voltage measurement unit configured to generate a measurement value indicative of a test voltage, wherein the measurement value is based partly on a temperature, the method comprising:
- applying the test voltage to the device;
- receiving a measurement value generated in response to the test voltage;
- receiving a temperature value generated based on the temperature;
- and
- calculating a compensated voltage value based on the measurement value, the temperature value, and stored gain and offset parameters of a compensation function, wherein the compensation function comprises a multiplication operation which multiplies the measurement value by an offset term summed with a gain term, wherein the offset term is the offset parameter and the gain term is the measurement temperature multiplied by the gain parameter.
An electronic device, comprising:
- a voltage measurement unit configured to generate a measurement value indicative of a value of a test voltage, wherein the measurement value is based partly on a temperature,
- a temperature sensor, configured to sense the temperature;
- a memory, configured to store gain and offset parameters of a compensation function;
- and
- a processor configured to receive the measurement value and a temperature value generated based on the sensed temperature, wherein the processor is configured to calculate a compensated voltage value based on the measurement value, the temperature value, and on the compensation function, wherein the compensation function comprises a multiplication operation which multiplies the measurement value by an offset term summed with a gain term, wherein the offset term is the offset parameter and the gain term is the measurement temperature multiplied by the gain parameter.
Dependencies are inferred from the claim text.