Vertical channel transistor with self-aligned gate electrode and method for fabricating the same
AssigneeSK hynix Inc.
InventorsHeung-Jae CHO, Eui-Seong HWANG, Eun-Shil PARK
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Abstract
A method for fabricating vertical channel transistors includes forming a plurality of pillars which have laterally opposing both sidewalls, over a substrate; forming a gate dielectric layer on both sidewalls of the pillars; forming first gate electrodes which cover any one sidewalls of the pillars and shield gate electrodes which cover the other sidewalls of the pillars and have a height lower than the first gate electrodes, over the gate dielectric layer; and forming second gate electrodes which are connected with upper portions of sidewalls of the first gate electrodes.
Claims29
A method for fabricating vertical channel transistors, comprising:
- forming a plurality of pillars which have laterally opposing both sidewalls, over a substrate;
- forming a gate dielectric layer on both sidewalls of the pillars;
- forming first gate electrodes which cover any one sidewalls of the pillars and shield gate electrodes which cover the other sidewalls of the pillars and have a height lower than the first gate electrodes, over the gate dielectric layer;
- and
- forming second gate electrodes which are connected with upper portions of sidewalls of the first gate electrodes.
A method for fabricating vertical channel transistors, comprising:
- forming a plurality of pillars which have laterally opposing both sidewalls, over a substrate;
- forming a gate dielectric layer on both sidewalls of the pillars;
- forming first gate electrodes which cover any one sidewalls of both sidewalls of the pillars;
- and
- forming second gate electrodes which are connected with upper portions of sidewalls of the first gate electrodes.
A method for fabricating a semiconductor device, comprising:
- forming hard mask layer patterns over a semiconductor substrate;
- forming bodies by etching the semiconductor substrate using the hard mask layer patterns as an etch barrier;
- forming buried bit lines in the bodies;
- etching the hard mask layer patterns and upper portions of the bodies to form pillars which have laterally opposing both sidewalls;
- forming first gate electrodes on any one sidewalls of both sidewalls of the pillars;
- forming second gate electrodes which are connected with upper portions of sidewalls of the first gate electrodes;
- and
- forming storage nodes which are connected with the pillars.
29-36. (canceled)
Dependencies are inferred from the claim text.