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US 2015/0029802 A1Published application
Apparatuses, integrated circuits, and methods for measuring leakage current
AssigneeMicron Technology, Inc.
InventorShigekazu Yamada
Life of this patent
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Abstract
Methods, apparatuses, and integrated circuits for measuring leakage current are disclosed. In one such example method, a word line is charged to a first voltage, and a measurement node is charged to a second voltage, the second voltage being less than the first voltage. The measurement node is proportionally coupled to the word line. A voltage on the measurement node is compared with a reference voltage. A signal is generated, the signal being indicative of the comparison. Whether a leakage current of the word line is acceptable or not can be determined based on the signal.
Claims20
An apparatus, comprising:
- a word line leakage measurement system coupled to word lines of a memory, the word line leakage measurement system configured to determine whether a level of leakage on a word line exceeds a threshold after compensating for noise encountered on the word line.
A method, comprising:
- determining a level of leakage on a word line;
- compensating for noise on the word line;
- and
- indicating whether the level of leakage on the word line exceeds a threshold after compensating for noise on the word line.
1 more element
Dependencies are inferred from the claim text.