High throughput partial wave spectroscopic microscopy and associated systems and methods
AssigneeNorthwestern University
InventorsVadim Backman, Hariharan Subramanian, John E. Chandler, Craig White, Jeremy D. Rogers, Lusik Cherkezyan
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Abstract
The present technology provides methods, systems, and apparatuses to achieve high throughput and high speed acquisition of partial wave spectroscopic (PWS) microscopic images. In particular, provided herein are high-throughput, automated partial wave spectroscopy (HT/A-PWS) instruments and systems capable of rapid acquisition of PWS Microscopic images and clinical, diagnostic, and research applications thereof.
Claims28
A method of selecting one or more target locations on a sample-containing substrate for partial wave spectroscopy (PWS) microscopy, comprising:
- (a) creating an image of the substrate at a first magnification using a PWS system;
- and
- (b) selecting the one or more target locations on the substrate for PWS microscopy at a second magnification based on the image, wherein the second magnification is higher than the first magnification.
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A method of analyzing a sample by high-throughput partial wave spectroscopy (PWS) microscopy, comprising:
- (a) selecting target locations on a sample-containing substrate, wherein selecting includes—
- creating an image of the substrate at a first magnification using PWS microscopy;
- and
- selecting one or more target locations on the substrate for PWS microscopy at a second magnification based on the image, wherein the second magnification is higher than the first magnification;
- and
- (b) obtaining PWS measurements of the one or more target locations at the second magnification.
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A partial wave spectroscopy (PWS) system, comprising:
- a tunable illumination system to provide a broad spectrum of incident light on a target;
- and
- a receiving end positioned in an imaging plane of the system to separately record intensity of multiple spectra of backscattered light from one or more preselected areas of the target illuminated with the incident light, wherein the multiple spectra of emergent light results from refractive index fluctuations within the target.
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Dependencies are inferred from the claim text.