Systems and methods mitigating temperature dependence of circuitry in electronic devices
AssigneeAnalog Test Engines
InventorJeffrey Allen King
Life of this patent
Estimating the term…
Abstract
Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
Claims14
An electronic device, comprising:
- a signal delay circuit, comprising:
- an input unit configured to receive input data and a reference signal, and
- an output unit configured to generate a delayed output signal based on the input data, wherein the delay of the output signal is dependent at least in part on the reference signal and is controllably dependent on a temperature, such that a change in the delay of the output signal in response to a change in the temperature is based partly on the reference signal;
- and
- a reference signal generator, comprising:
- an input unit configured receive a control input, and
- an output unit configured to generate the reference signal of the signal delay circuit, wherein the reference signal is dependent at least in part on the temperature, and wherein the temperature dependence of the reference signal is based at least in part on the control input.
A method of programming an electronic device, the device comprising a signal delay circuit and a programmable reference signal generator, wherein the reference signal generator is configured to generate a reference signal based at least in part on a programmable code value and on a temperature, and wherein the signal delay circuit is configured to generate a delayed output signal based on input data, wherein the delay of the output signal is dependent at least in part on the reference signal, the method comprising:
- programming the reference signal generator with each of multiple code values;
- setting the temperature to each of multiple temperature values;
- measuring the delay in the output signal for each of a plurality of combinations of the multiple code values and the multiple temperature values;
- selecting a programming code value based on the measured delays;
- and
- programming the input signal generator with the programming code value.
Dependencies are inferred from the claim text.