Resistance switching device and process for producing thereof
AssigneesMurata Manufacturing Co., Ltd., National Institute for Materials Science
InventorsSakyo Hirose, Naoki Ohashi, Hideki Yoshikawa
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AssigneesMurata Manufacturing Co., Ltd., National Institute for Materials Science
InventorsSakyo Hirose, Naoki Ohashi, Hideki Yoshikawa
Estimating the term…
resistance switching device having a high resistance variation ratio, an excellent response characteristic, an excellent resistance memory characteristic (retention characteristics) and an excellent repeat resistance. The resistance switching device comprises an n-type oxide semiconductor and first and second electrodes which are disposed so as to interpose at least a part of the n-type oxide semiconductor therebetween wherein a Schottky junction which provides resistance variation/memory characteristics by the application of voltage having different polarities between the first and second electrodes is formed at an interface between the n-type oxide semiconductor and the first electrode; and the first electrode is positioned such that it is in contact with the n-type oxide semiconductor, and has a lower layer which is formed from Au oxide or a Pt oxide or Au or Pt containing oxygen having the thickness of 1-50 nm.
A resistance switching device comprising:
A resistance switching device comprising:
A method for fabricating a resistance switching device having a Schottky junction with resistance variation memory characteristics when a voltage having different polarities is applied to the device, the method comprising:
Dependencies are inferred from the claim text.