Method for imaging mass analysis using physical vapor deposition of platinum nanoparticles
AssigneesThe School Corporation Kansai University, Nissan Chemical Industries, Ltd.
InventorsRyuichi Arakawa, Hideya Kawasaki, Tomoyuki Ozawa
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Abstract
The present invention provides an improved method for imaging mass spectrometry using an ionization-assisting matrix of a test sample, wherein the ionization efficiency is high, migration and visual information reduction are inhibited, no interference peaks originating from the matrix occur, and the analysis can be performed at high spatial resolution. Specifically, the present invention provides a method for imaging mass spectrometry using a sample prepared by physical vapor depositing platinum nanoparticles on the surface of a test sample to be subjected to imaging mass spectrometry.
Claims9
A method for imaging mass spectrometry using a sample prepared by physical vapor depositing platinum nanoparticles on a surface of a test sample to be subjected to imaging mass spectrometry.
A method for preparing a sample for imaging mass spectrometry, comprising physical vapor depositing platinum nanoparticles on a surface of a test sample to be subjected to imaging mass spectrometry.
Dependencies are inferred from the claim text.