Loading patent…
AssigneeMentor Graphics Corporation
InventorsJanusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski
Estimating the term…
Aspects of the invention relate to test generation techniques for test-per-clock. Test cubes may be generated by adding constraints to a conventional automatic test pattern generator. During a test cube merging process, a first test cube is merged with one or more test cubes that are compatible with the first test cube to generate a second test cube. The second test cube is shifted by one bit along a direction of scan chain shifting to generate a third test cube. The third test cube is then merged with one or more test cubes in the test cubes that are compatible with the third test cube to generate a fourth test cube. The shifting and merging operations may be repeated for a predetermined number of times.
A method, executed by at least one processor of a computer, comprising:
One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:
A system comprising:
Dependencies are inferred from the claim text.