Scan Chain Configuration For Test-Per-Clock Based On Circuit Topology
AssigneeMentor Graphics Corporation
InventorsJanusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski
Life of this patent
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Abstract
Aspects of the invention relate to generating scan chain configurations for test-per-clock based on circuit topology. With various implementations of the invention, weight vectors between scan chains in a circuit are first determined. Based on the weight vectors, a scan chain configuration is generated by assigning some scan chains in the scan chains to a stimuli group and some other scan chains in the scan chains to a compacting group. Here, the stimuli group comprises scan chains to operate in a shifting-launching mode, and the compacting group comprises scan chains to operate in a capturing-compacting-shifting mode.
Claims14
A method, executed by at least one processor of a computer, comprising:
- determining weight vectors between scan chains in a circuit, value and direction of a weight vector between two scan chains representing number and direction of combinational circuit paths connecting scan cells of the two scan chains, respectively;
- generating a scan chain configuration by assigning, based on the weight vectors, some scan chains in the scan chains to a stimuli group and some other scan chains in the scan chains to a compacting group, wherein the stimuli group comprises scan chains to operate in a shifting-launching mode, the compacting group comprises scan chains to operate in a capturing-compacting-shifting mode, and total weight of weight vectors directed from the stimuli group the compacting group is maximized under at least one condition with respect to number of scan chains in the stimuli group, the compacting group, or both;
- and
- storing information of the scan chain configuration.
One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:
- determining weight vectors between scan chains in a circuit, value and direction of a weight vector between two scan chains representing number and direction of combinational circuit paths connecting scan cells of the two scan chains, respectively;
- generating a scan chain configuration by assigning, based on the weight vectors, some scan chains in the scan chains to a stimuli group and some other scan chains in the scan chains to a compacting group, wherein the stimuli group comprises scan chains to operate in a shifting-launching mode, the compacting group comprises scan chains to operate in a capturing-compacting-shifting mode, and total weight of weight vectors directed from the stimuli group the compacting group is maximized under at least one condition with respect to number of scan chains in the stimuli group, the compacting group, or both;
- and
- storing information of the scan chain configuration.
Dependencies are inferred from the claim text.