Method for verifying bad pattern in time series sensing data and apparatus thereof
AssigneeSamsung Sds Co., Ltd.
InventorsKae Young SHIN, Dae Jung AHN, Dae Hong SEO, Woo Young JUNG
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AssigneeSamsung Sds Co., Ltd.
InventorsKae Young SHIN, Dae Jung AHN, Dae Hong SEO, Woo Young JUNG
Estimating the term…
A method for verifying bad pattern in time series sensing data by calculating a bad pattern error rate, which can be applied to the time series sensing data measured and produced from a predetermined sensor provided in predetermined equipment, and an apparatus thereof are provided. The method includes receiving information on the bad pattern applied to time series sensing data measured by a suspicious sensor, accessing the time series sensing data of each product, generated by the suspicious sensor during a verification period, calculating similarity measures between the bad pattern based on the bad pattern information and the time series sensing data for each product, and calculating an error rate of the bad pattern based on the similarity measures.
A method for verifying a bad pattern in sensing data, the method comprising:
An apparatus for verifying a bad pattern in sensing data, the apparatus comprising:
A method for monitoring sensing data of equipment, the method comprising:
Production equipment comprising:
A reference pattern detecting apparatus comprising:
Dependencies are inferred from the claim text.