Information processing apparatus, method for controlling the same and program

A method for controlling an information processing apparatus including a wide IO memory device stacked on an SoC die that includes a CPU, the method comprising steps of:

• acquiring, from a temperature sensor provided in a memory chip that is included in the wide IO memory device, sensor information that indicates a temperature of the memory chip at the location of the temperature sensor;
• generating temperature distribution information indicating a current temperature distribution in the memory chip based on sensor information acquired in the acquiring step and predetermined temperature information that includes information that was generated using an analysis executed in advance and is related to the temperature distribution in the memory chip, the predetermined temperature information corresponding to operating states of the SoC die and the wide IO memory device;
• and
• setting a thermal offset value to be used for a refresh operation of the memory chip in accordance with a difference between the temperature at a location at which the temperature is the highest in the memory chip and the temperature at the location of the temperature sensor that are included in the temperature distribution indicated by the temperature distribution information.

A non-transitory computer-readable storage medium storing a computer program for causing a computer to execute steps of a method for controlling an information processing apparatus including a wide IO memory device stacked on an SoC die that includes a CPU, the method comprising steps of:

• acquiring, from a temperature sensor provided in a memory chip that is included in the wide IO memory device, sensor information that indicates a temperature of the memory chip at the location of the temperature sensor;
• generating temperature distribution information indicating a current temperature distribution in the memory chip based on sensor information acquired in the acquiring step and predetermined temperature information that includes information that was generated using an analysis executed in advance and is related to the temperature distribution in the memory chip, the predetermined temperature information corresponding to operating states of the SoC die and the wide IO memory device;
• and
• setting a thermal offset value to be used for a refresh operation of the memory chip in accordance with a difference between the temperature at a location at which the temperature is the highest in the memory chip and the temperature at the location of the temperature sensor that are included in the temperature distribution indicated by the temperature distribution information.