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US 2014/0370586 A1Published application
Microchip and microchip-type fine-particle measuring device
AssigneeSony Corporation
InventorsKatsuhiro Seo, Koichi Tsukihara, Yoshiki Okamoto, Shunpei Suzuki
Life of this patent
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Abstract
A microchip is provided. The microchip includes an incident surface configured to receive light transmitted from a light source, the light being received from an incident direction and a back surface that is opposite the incident surface, the back surface including a portion that is configured to reflect light transmitted from the light source away from the incident direction.
Claims20
A microchip comprising:
- an incident surface configured to receive light transmitted from a light source, the light being received from an incident direction;
- and
- a back surface that is opposite the incident surface, the back surface including a portion that is configured to reflect light transmitted from the light source away from the incident direction.
A microchip system comprising:
- an incident surface configured to receive light transmitted from a light source, the light being received from an incident direction;
- a back surface that is opposite the incident surface, the back surface including a portion that is configured to reflect light transmitted from the light source away from the incident direction;
- and
- a channel configured to host a particle for irradiation by the light source.
1 more element
Dependencies are inferred from the claim text.