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US 2014/0369145 A1Published application
Semiconductor Device and Test Method Thereof
AssigneePS4 Luxco S.a.r.l.
InventorNaohisa Nishioka
Life of this patent
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Abstract
A semiconductor chip includes a memory array including a plurality of memory cells, a plurality of terminals including a plurality of test terminals to output a result of a specific test, and a circuit that outputs the result to a selected one of the plurality of test terminals based on a chip identification data.
Claims6
A semiconductor chip comprising:
- a memory array including a plurality of memory cells;
- a plurality of terminals including a plurality of test terminals to output a result of a specific test;
- and
- a circuit that outputs the result to a selected one of the plurality of test terminals based on a chip identification data.
1 more element
Dependencies are inferred from the claim text.