Machine Vision Inspection System and Method for Performing High-Speed Focus Height Measurement Operations
AssigneeMitutoyo Corporation
InventorPaul Gerard Gladnick
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AssigneeMitutoyo Corporation
InventorPaul Gerard Gladnick
Estimating the term…
A machine vision inspection system comprising an illumination source and an imaging system and a method for performing high-speed focus height measurement operations. The method comprises: placing a workpiece in a field of view of the machine vision inspection system; determining a region of interest for focus height measurement operations; operating the illumination source to illuminate the workpiece with strobed illumination; periodically modulating a focus position of the imaging system along a Z-height direction proximate to the workpiece; collecting an image stack, wherein each image of the image stack corresponds to an instance of strobed illumination matched with a phase of the modulated focus position corresponding to an appropriate Z height within the image stack; and determining a Z-height measurement for at least one portion of the region of interest.
A method for performing high-speed focus height measurement operations in a machine vision inspection system comprising an illumination source and an imaging system that comprises a camera system, the method comprising:
A machine vision inspection system configurable to collect a stack of images of a workpiece at a plurality of Z heights in order to measure Z heights based on a best focus height for a plurality of sub-regions of a region of interest, the machine vision inspection system comprising:
Dependencies are inferred from the claim text.