US 2014/0368640 A1Published application

Method and system for performing alignment of a projection image to detected infrared (ir) radiation information

AssigneeFLIR Systems, Inc.

InventorsKatrin Strandemar, Henrik Jönsson

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Abstract

A method of presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on IR radiation emitted from said observed real world scene, using a thermography arrangement comprising an IR imaging system, a visible light imaging system, and a visible light projecting system.

Claims20

Dependent claims

capturing IR radiation information based on detected IR radiation emitted from said observed real world scene according to a first field of view of said IR imaging system;
creating a visible representation of said detected IR radiation in the form of an IR image;
projecting a visible light pattern onto said observed real world scene according to a second field of view of said visible light projecting system, said second field of view at least partially overlapping said first field of view;
capturing a visible light image of said observed real world scene, said scene comprising said projected visible light pattern, according to a third field of view of said visible light imaging system, said third field of view at least partially overlapping the first and/or the second field of view;
detecting said projected visible light pattern in said captured visible light image;
determining the pixel displacement d(pix vis), in pixel coordinates in the visible light image, between the pixel coordinates of said detected visible light pattern and calculated pixel coordinates of said projected visible light pattern where the projected light pattern would appear if the visible light imaging system and the visible light projecting system were aligned, dependent on a predetermined relation between said visible light imaging light imaging system and said visible light projecting system;
determining the pixel displacement d(pix IR), in pixel coordinates in the IR image, between the IR image and the visible light image, based on said pixel displacement d(pix vis) between the detected projected visible light pattern and the visible light image, dependent on a predetermined relation between said IR imaging system and said visible light projecting system;
aligning said IR image to the detected IR radiation emitted from said observed real world scene, based on said pixel displacement d(pix IR);
and
presenting said aligned IR image by projecting it onto said real world scene according to the second field of view in alignment with the detected IR radiation emitted from the observed real world scene.

7 more elements

A thermography arrangement for presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on IR radiation emitted from said real world scene, the arrangement comprising:

an IR imaging system for detecting IR radiation emitted from said observed real world scene according to a first field of view;
a processor adapted to capture IR radiation information based on detected IR radiation emitted from said observed real world scene according to a first field of view of said IR imaging system, thereby creating a visible representation of said detected IR radiation in the form of an IR image;
a visible light projecting system adapted to project a visible light pattern and/or image onto said observed real world scene according to a second field of view, at least partially overlapping the first field of view;
a visible light imaging system adapted to capture a visible light image of said observed real world scene, according to a third field of view, the third field of view at least partially overlapping the first and/or second field of view;
said processor further being adapted to:
project a visible light pattern onto said observed real world scene according to a second field of view of said visible light projecting system, said second field of view at least partially overlapping said first field of view,
capture a visible light image of said observed real world scene, said scene comprising said projected visible light pattern, according to a third field of view of said visible light imaging system, said third field of view at least partially overlapping the first and/or the second field of view,
detect said projected visible light pattern in said captured visible light image,
determine the pixel displacement d(pix vis), in pixel coordinates in the visible light image, between the pixel coordinates of said detected visible light pattern and calculated pixel coordinates of said projected visible light pattern where the projected light pattern would appear if the visible light imaging system and the visible light projecting system were aligned, dependent on a predetermined relation between said visible light imaging light imaging system and said visible light projecting system,
determine the pixel displacement d(pix IR), in pixel coordinates in the IR image, between the IR image and the visible light image, based on said pixel displacement d(pix vis) between the detected projected visible light pattern and the visible light image, dependent on a predetermined relation between said IR imaging system and said visible light projecting system,
align said IR image to the detected IR radiation emitted from said observed real world scene, based on said pixel displacement d(pix IR), and
present said aligned IR image by projecting it onto said real world scene according to the second field of view, in alignment with the detected IR radiation emitted from the observed real world scene.

9 more elements

Dependencies are inferred from the claim text.

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Abstract

capturing IR radiation information based on detected IR radiation emitted from said observed real world scene according to a first field of view of said IR imaging system;
creating a visible representation of said detected IR radiation in the form of an IR image;
projecting a visible light pattern onto said observed real world scene according to a second field of view of said visible light projecting system, said second field of view at least partially overlapping said first field of view;
capturing a visible light image of said observed real world scene, said scene comprising said projected visible light pattern, according to a third field of view of said visible light imaging system, said third field of view at least partially overlapping the first and/or the second field of view;
detecting said projected visible light pattern in said captured visible light image;
determining the pixel displacement d(pix vis), in pixel coordinates in the visible light image, between the pixel coordinates of said detected visible light pattern and calculated pixel coordinates of said projected visible light pattern where the projected light pattern would appear if the visible light imaging system and the visible light projecting system were aligned, dependent on a predetermined relation between said visible light imaging light imaging system and said visible light projecting system;
determining the pixel displacement d(pix IR), in pixel coordinates in the IR image, between the IR image and the visible light image, based on said pixel displacement d(pix vis) between the detected projected visible light pattern and the visible light image, dependent on a predetermined relation between said IR imaging system and said visible light projecting system;
aligning said IR image to the detected IR radiation emitted from said observed real world scene, based on said pixel displacement d(pix IR);
and
presenting said aligned IR image by projecting it onto said real world scene according to the second field of view in alignment with the detected IR radiation emitted from the observed real world scene.

7 more elements