Semiconductor device and test method
AssigneeLapis Semiconductor Co., Ltd.
InventorMasayuki OTSUKA
Life of this patent
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Abstract
A test voltage having a first voltage or a second voltage is applied to an output terminal of a complementary fuse that includes a first fuse to one end of which the first voltage is applied and the other end of which serves as the output terminal and a second fuse to one end of which the second voltage is applied and the other end of which is connected to the output terminal. The test voltage then stops being applied. In such a state, whether output data from the output terminal of the complementary fuse coincides with an expected value is determined. The result of determination is output as a test result.
Claims7
A semiconductor device comprising:
- a fuse circuit including a complementary fuse;
- a test voltage application circuit;
- and
- a comparison circuit, wherein
- the complementary fuse includes a first fuse to one end of which a first voltage is applied and the other end of which serves as an output terminal and a second fuse to one end of which a second voltage is applied and the other end of which is connected to the output terminal,
- the test voltage application circuit is configured to apply a test voltage having the first voltage or the second voltage to the output terminal of the complementary fuse and then stop applying the test voltage, and
- the comparison circuit is configured to determine, after the test voltage application circuit stops applying the test voltage, whether or not output data from the output terminal of the complementary fuse coincides with an expected value, and output the result of determination as a test result.
A test method of a semiconductor device, the semiconductor device including a complementary fuse that includes a first fuse to one end of which a first voltage is applied and the other end of which serves as an output terminal and a second fuse to one end of which a second voltage is applied and the other end of which is connected to the output terminal, the test method comprising:
- performing a first test sequence and a second test sequence in succession, the first test sequence including applying a test voltage having the first voltage to the output terminal of the complementary fuse and then obtaining a first comparison result by comparing whether output data from the output terminal of the complementary fuse coincides with an expected value, the second test sequence including applying the test voltage having the second voltage to the output terminal of the complementary fuse and then obtaining a second comparison result by comparing whether the output data from the output terminal of the complementary fuse coincides with the expected value;
- and
- outputting a test result indicating a conforming item if the first comparison result and the second comparison result both indicate coincidence, and outputting, the test result indicating a defective item if the first or second comparison result indicates non-coincidence.
Dependencies are inferred from the claim text.