# US 2014/0360289 A1 · Nondestructive Inspection System for Difficult to Access Areas > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2014/0360289 A1 - Document ID: US20140360289A1 - Status: Published application - Kind: A1 - Application number: 13/915,121 - Filed: 2013-06-11 - Published: 2014-12-11 - Earliest claimed: 2013-06-11 - Assignees: The Boeing Company - Applicants: The Boeing Company - Inventors: Gary Ernest Georgeson; James J. Troy; Nathan Rylan Smith; Donald Duane Palmer, JR. - Web page: https://patentgrep.com/patent/US20140360289A1 ## CPC - G01D 11/30: Supports specially adapted for an instrument; Supports specially adapted for a set of instruments - G01N 21/954: Inspecting the inner surface of hollow bodies, e.g. bores - G01N 29/225: {Supports, positioning or alignment in moving situation} - G01N 29/265: by moving the sensor relative to a stationary material - G01N 27/902: {by moving the sensors} - G01N 2291/2638: Complex surfaces - G01N 2291/2694: Wings or other aircraft parts - G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) ## Abstract A method for inspecting an object. A support structure physically associated with a first sensor and a second sensor is moved to an area for inspection. The support structure is in a first configuration and the first sensor and the second sensor are positioned about an axis extending through the support structure when the support structure is in the first configuration. The support structure is changed from the first configuration to a second configuration. The first sensor and the second sensor are configured to generate information when the support structure is in the second configuration. ## Claims ### Claim 1 An apparatus comprising: a sensor; a tool; and a support structure physically associated with the sensor and the tool, wherein the support structure is configured to change between a first configuration and a second configuration, wherein the support structure with the sensor and the tool are configured to move through an opening in an object when the support structure is in the first configuration. ### Claim 2 (depends on 1) The apparatus of claim 1 further comprising: a movement system configured to move the support structure between the first configuration and the second configuration. ### Claim 3 (depends on 1) The apparatus of claim 1, wherein the sensor is a first sensor, and the tool is a second sensor and wherein the first sensor and the second sensor are in a position such that both the first sensor and the second sensor are configured to generate information in a desired manner when the support structure is in the second configuration. ### Claim 4 (depends on 1) The apparatus of claim 1, wherein the sensor and the tool are positioned about an axis extending through the support structure when the support structure is in the first configuration. ### Claim 5 (depends on 4) The apparatus of claim 4, wherein the tool is located in front of the sensor when the support structure is in the first configuration and wherein the tool is configured to move away from the axis out of the way of the sensor when the support structure changes from the first configuration to the second configuration. ### Claim 6 (depends on 1) The apparatus of claim 1, wherein the support structure comprises: a base section, wherein the sensor is physically associated with the base section; a moveable section, wherein the tool is physically associated with the moveable section; and a connector system connected to the base section and the moveable section, wherein the moveable section is configured to move relative to the base section such that the tool moves relative to the sensor when the support structure changes between the first configuration and the second configuration. ### Claim 7 (depends on 6) The apparatus of claim 6, wherein the connector system is a linkage system. ### Claim 8 (depends on 1) The apparatus of claim 1, wherein the sensor is selected from one of a camera, a video imaging system, and a borescope. ### Claim 9 (depends on 1) The apparatus of claim 1, wherein the tool is selected from one of an eddy current sensor, an ultrasonic transducer, a chemical sensor, a biological sensor, an infrared sensor, a thermocouple temperature sensor, a magnetic field sensor, a vibration sensor, an electrical potential sensor, an electrostatic discharge sensor, a marking instrument, a light, a pen, a marker, a sealant applicator, and a paint applicator. ### Claim 10 (depends on 2) The apparatus of claim 2, wherein the movement system is selected from at least one of a cable and an actuator. ### Claim 11 (depends on 1) The apparatus of claim 1, wherein the sensor, the tool, and the support structure with the support structure in the first configuration are configured be moved through a fastener hole. ### Claim 12 (depends on 1) The apparatus of claim 1, wherein the object is selected from one of a mobile platform, a stationary platform, a land-based structure, an aquatic-based structure, a space-based structure, a deformable structure, a flexible fuel bag, a fuel line, a surface ship, a tank, a personnel carrier, a train, a spacecraft, a space station, a satellite, a submarine, an automobile, a power plant, a bridge, a dam, a house, a manufacturing facility, a building, an aircraft wing, a fairing, a fuel tank, a fuselage, an engine, and a duct system. ### Claim 13 A nondestructive inspection system comprising: a borescope; a sensor; and a support structure physically associated with the borescope and the sensor, wherein the borescope and the sensor are positioned about an axis extending through the support structure when the support structure is in a first configuration; the support structure is configured to change between the first configuration and a second configuration; the support structure with the borescope and the sensor are configured to move through an opening in a structure when the support structure is in the first configuration; and the borescope and the sensor are configured to generate information when the support structure is in the second configuration. ### Claim 14 (depends on 13) The nondestructive inspection system of claim 13, wherein the borescope and the sensor are positioned about the axis extending though the support structure; the sensor is located in front of the borescope when the support structure is in the first configuration; and the sensor is configured to move away from the axis when the support structure changes from the first configuration to the second configuration. ### Claim 15 (depends on 13) The nondestructive inspection system of claim 13, wherein the support structure comprises: a base section, wherein the borescope is physically associated with the base section; a moveable section, wherein the sensor is physically associated with the moveable section; and a connector system connected to the base section and the moveable section, wherein the moveable section is configured to move relative to the base section such that the sensor moves relative to the borescope when the support structure changes between the first configuration and the second configuration. ### Claim 16 (depends on 15) The nondestructive inspection system of claim 15, wherein the connector system is a linkage system. ### Claim 17 A method for inspecting an object, the method comprising: moving a support structure physically associated with a first sensor and a second sensor to an area for inspection, wherein the support structure is in a first configuration and the first sensor and the second sensor are positioned about an axis extending through the support structure when the support structure is in the first configuration; and changing the support structure from the first configuration to a second configuration, wherein the first sensor and the second sensor are configured to generate information when the support structure is in the second configuration. ### Claim 18 (depends on 17) The method of claim 17 further comprising: moving the support structure in the second configuration using first information in the information generated by the first sensor for guiding the support structure to a desired position relative to the area for the inspection; and generating second information in the information with the second sensor when the second sensor is in the desired position relative to the area for inspection. ### Claim 19 (depends on 17) The method of claim 17, wherein moving the support structure physically associated with the first sensor and the second sensor in the first configuration to the area for inspection, wherein the first sensor and the second sensor are positioned about the axis extending through the support structure when the support structure is in the first configuration comprises: moving the support structure physically associated with the first sensor and the second sensor in the first configuration through an opening to the area for inspection, wherein the first sensor and the second sensor are positioned about the axis extending through the support structure when the support structure is in the first configuration. ### Claim 20 (depends on 17) The method of claim 17, wherein the support structure comprises a base section, wherein the first sensor is physically associated with the base section; a moveable section, wherein the second sensor is physically associated with the moveable section; and a connector system connected to the base section and the moveable section, wherein the moveable section is configured to move relative to the base section such that the second sensor moves relative to the first sensor when the support structure changes between the first configuration and the second configuration.