System and method for inspecting harmful information of mobile device
AssigneeElectronics and Telecommunications Research Institute
InventorsSeok-Hyun KIM, Jin-Man CHO, Young-Seob CHO, Sang-Rae CHO, Dae-Seon CHOI, Jong-Hyouk NOH, Soo-Hyung KIM, Seung-Hyun KIM, Seung-Hun JIN
Life of this patent
Estimating the term…