Testing apparatus and testing method

A testing apparatus, for executing a test program, so as to perform a first test on a circuit component on a circuit board and to perform a second test on the circuit board, comprising:

• a first module, comprising:
• a control unit, for receiving an instruction and generating a first control signal or a second control signal according to the instruction, wherein the instruction is for instructing the testing apparatus to perform the first test or the second test;
• a signal generation unit, coupled to the control unit, and used for receiving the first control signal and generating a current signal or a voltage signal according to the first control signal;
• a signal processing unit, coupled to the control unit, and used for receiving a measurement signal generated by the circuit board and performing numerical calculation on the measurement signal to generate a numerical signal;
• a signal expansion unit, coupled to the control unit, and used for receiving a first data signal generated by the circuit board and expanding the first data signal to generate a second data signal;
• and
• a power supply unit, coupled to the control unit, and used for receiving the second control signal and generating a working voltage according to the second control signal;
• and
• a second module, comprising:
• a test address assignment unit, coupled to the circuit board, and used for assigning an address for the circuit component and returning the measurement signal to the signal processing unit according to the address assigned;
• and
• a signal isolation unit, coupled to the test address assignment unit, and used for performing noise immunization process on the measurement signal;
• and
• a signal transmission line, coupled between the signal generation unit and the signal isolation unit, and used for connecting the first module and the second module;
• wherein when the testing apparatus performs the second test, the power supply unit generates the working voltage for the signal generation unit, the signal processing unit, the signal expansion unit, the test address assignment unit, and the signal isolation unit.