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US 2014/0349223 A1Published application
Actinic-ray- or radiation-sensitive resin composition, actinic-ray-or radiation-sensitive film therefrom, method of forming pattern, process for manufacturing semiconductor device, semiconductor device and compound
AssigneeFUJIFILM Corporation
InventorsTakeshi KAWABATA, Hideaki TSUBAKI, Hiroo TAKIZAWA
Life of this patent
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Abstract
Provided is an actinic-ray- or radiation-sensitive resin composition including a compound that when exposed to actinic rays or radiation, generates any of acids of general formula (I) below.
Claims11
An actinic-ray- or radiation-sensitive resin composition comprising a compound that when exposed to actinic rays or radiation, generates any of acids of general formula (I) below,
- in which
- L1 represents a single bond, —O—, —S—, —C(═O)—, —C(═O)O—, —OC(═O)—, —S(═O)—, —S(═O)2—, an optionally substituted methylene group or an optionally substituted ethylene group;
- Ar1 represents an aryl group;
- R1 represents a monovalent substituent, provided that at least one R1 represents a group having two or more carbon atoms, and that when n is 2 or greater, two or more R's may be identical to or different from each other and may be connected to each other to thereby form a ring;
- m is an integer of 1 to 4;
- and
- n is an integer of 1 to 5.
4 more elements
A compound of general formula (II) below,
- in which
- R2 represents a monovalent substituent, provided that at least one R2 represents a group having two or more carbon atoms, and that when n is 2 or greater, two or more R2s may be identical to or different from each other and may be connected to each other to thereby form a ring;
- n is an integer of 1 to 5;
- and
- X+ represents a cation.
2 more elements
Dependencies are inferred from the claim text.