# US 2014/0333920 A1 · Systems and methods for fluid analysis using electromagnetic energy > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2014/0333920 A1 - Document ID: US20140333920A1 - Status: Published application - Kind: A1 - Application number: 14/206,055 - Filed: 2014-03-12 - Published: 2014-11-13 - Earliest claimed: 2013-03-12 - Assignees: Visualant, Inc. - Applicants: Visualant, Inc. - Inventors: Richard Ian Mander; Thomas A. Furness, III; Brian T. Schowengerdt; Michael Vivian Denton; Allan David Beach; Alan Charles Tompkins - Web page: https://patentgrep.com/patent/US20140333920A1 ## CPC - G01N 21/01: Arrangements or apparatus for facilitating the optical investigation - G01N 21/031: {Multipass arrangements} - G01N 21/274: {Calibration, base line adjustment, drift correction} - G01N 21/3504: for analysing gases, e.g. multi-gas analysis - G01N 21/51: inside a container, e.g. in an ampoule (G01N21/53 takes precedence) - G01N 21/65: Raman scattering - G01J 3/44: Raman spectrometry; Scattering spectrometry {; Fluorescence spectrometry} - G01N 2021/0106: {General arrangement of respective parts} - G01N 2021/513: {Cuvettes for scattering measurements} - G01N 2021/516: {Multiple excitation of scattering medium, e.g. by retro-reflected or multiply reflected excitation rays} - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N) ## Abstract Systems for analyzing fluids (e.g., gases) include a chamber structure with a reflective inner surface, emitters, a primary detector positioned to principally detect electromagnetic energy reflected numerous times through the gas(es) and a calibration detector positioned to detect electromagnetic energy not reflected numerous times through the gas(es). Calibration may be automatically performed. The primary detector relies principally on Raleigh scattering. An optional primary detector may be positioned to principally detect Raman scattered electromagnetic energy. ## Claims ### Claim 1 A sampling system, comprising: an elongated chamber structure to hold a fluid to be sampled, the elongated chamber structure having at least one wall that at least partially separates an interior of the chamber structure from an exterior thereof, the chamber structure having a first end and a second end, the second end opposite from the first end along a length of the chamber structure, at least a first portion of the elongated chamber structure reflective at least laterally across the interior of the chamber structure along at least a first portion of the length of the chamber structure; a set of emitters positioned to emit electromagnetic energy into the interior of the chamber structure proximate the first end laterally across the interior of the chamber structure, and at an angle extending toward the second end from the first end; at least one primary lateral sampling detector positioned to detect electromagnetic energy from the interior of the chamber structure proximate the second end of the chamber structure and laterally with respect to the length of the chamber structure; and at least one calibration detector positioned to detect electromagnetic energy from the interior of the chamber structure proximate the first end of the chamber structure and spaced relatively toward the second end with respect to the set of emitters. ### Claim 2 (depends on 1) The sampling system of claim 1 wherein the set of emitters are positioned to emit electromagnetic energy into the interior of the chamber structure at an angle extending toward the second end from at least proximate the first end of the chamber structure. ### Claim 3 (depends on 2) The sampling system of claim 2 wherein the angle is a user selectively adjustable angle. ### Claim 4 (depends on 2) The sampling system of claim 2 wherein the angle is selectively adjustable to achieve a defined at least minimum number of reflections of electromagnetic energy laterally across the interior of the chamber structure as the electromagnetic energy passes from the set of emitters to the at least one primary lateral sampling detector. ### Claim 5 (depends on 4) The sampling system of claim 4 wherein the defined at least minimum number of reflections of electromagnetic energy is greater than a number of reflections of the electromagnetic energy laterally across the interior of the chamber structure as the electromagnetic energy passes from the set of emitters to the at least one calibration detector. ### Claim 6 (depends on 4) The sampling system of claim 4 wherein the defined at least minimum number of reflections of electromagnetic energy is at least ten times greater than a number of reflections of the electromagnetic energy laterally across the interior of the chamber structure as the electromagnetic energy passes from the set of emitters to the at least one calibration detector. ### Claim 7 (depends on 1) The sampling system of claim 1 wherein the set of emitters are moveable to emit electromagnetic energy into the interior of the chamber structure at a user selectively adjustable angle extending toward the second end from at least proximate the first end of the chamber structure. ### Claim 8 (depends on 1) The sampling system of claim 1 wherein the set of emitters are pivotally mounted for rotation with respect to the interior of the chamber structure at a user selectively adjustable angle extending toward the second end from at least proximate the first end of the chamber structure. ### Claim 9 (depends on 1) The sampling system of claim 1 wherein a ratio of distance between the set of emitters and the at least one primary lateral sampling detector and a width of the interior of the chamber structure allows from one to at least 25 passes along a length of the chamber structure. ### Claim 10 (depends on 1) The sampling system of claim 1 wherein the at least one primary lateral sampling detector includes a photodiode response to at least some near-infrared wavelengths of the electromagnetic energy through at least some near-ultraviolet wavelengths of the electromagnetic energy. ### Claim 11 (depends on 1) The sampling system of claim 1 wherein the at least one primary lateral sampling detector includes at least one photodiode. ### Claim 12 (depends on 11) The sampling system of claim 11, further comprising: at least one primary axial sampling detector positioned to detect electromagnetic energy from the interior of the chamber structure proximate the second end of the chamber structure, axially along the length of the chamber structure. ### Claim 13 (depends on 12) The sampling system of claim 12 wherein at least a second portion of the elongated chamber structure is non-reflective at least laterally across the interior of the chamber structure along at least a second portion of the length of the chamber structure immediately preceding the at least one primary axial sampling detector. ### Claim 14 (depends on 12) The sampling system of claim 12, further comprising a shroud having a proximal end and a distal end, the shroud extending at the proximate end thereof from the second end of the chamber structure, the shroud having an interior wall that is nonreflective, and wherein the at least one primary axial sampling detector is positioned at least proximate the distal end of the shroud. ### Claim 15 (depends on 12) The sampling system of claim 12 wherein the at least one primary axial sampling detector includes at least one a complementary metal oxide semiconductor (CMOS) detector, a charged coupled detector (CCD) detector, or a two-dimensional image detector. ### Claim 16 (depends on 1) The sampling system of claim 1, further comprising: at least one port to selectively provide fluid communicative coupling between the interior and the exterior of the chamber structure. ### Claim 17 (depends on 16) The sampling system of claim 16 wherein the interior of the chamber structure is selectively sealable at pressures greater than one atmospheres. ### Claim 18 (depends on 16) The sampling system of claim 16 wherein the interior of the chamber structure is selectively sealable at pressures greater than X atmospheres. ### Claim 19 A sampling system for sampling pressurized gases, the sampling system comprising: an elongated tubular structure having a first end, a second end, a principal axis extending between the first and the second ends, an interior surface that forms an interior to hold pressurized gases to be sampled, at least a portion of the interior surface of the tubular structure optically reflective at least laterally across the principal axis along at least a first portion of a length of the tubular structure; a plurality of emitters operable to provide electromagnetic energy in the interior of the tubular structure at least proximate the first end and directed at least partially laterally across the interior of the tubular structure at an angle to the principal axis that extends toward the second end, each of the emitters selectively operable to emit electromagnetic energy in a respective range of wavelengths in an optical portion of the electromagnetic spectrum, the ranges of wavelengths of at least some of the emitters different from the ranges of wavelengths of others of the emitters; at least one primary lateral sampling detector positioned laterally of the principal axis to detect primarily Rayleigh scattered electromagnetic energy from the pressurized gases to be sampled proximate the second end of the chamber structure; and at least one primary axial sampling detector positioned axially to the principal axis to detect primarily Ramen scattered electromagnetic energy from the pressurized gas to be sampled proximate the second end of the chamber structure; and at least one calibration detector positioned laterally of the principal axis to detect primarily Rayleigh scattered electromagnetic energy from the pressurized gases to be sampled proximate the first end of the chamber structure. ### Claim 20 (depends on 19) The sampling system of claim 19 wherein the at least one primary lateral sampling detector includes at least one photodiode, and the at least one primary axial sampling detector includes at least one a complementary metal oxide semiconductor (CMOS) detector, a charged coupled detector (CCD) detector, or a two-dimensional image detector. ### Claim 21 (depends on 20) The sampling system of claim 20 wherein the at least one calibration detector includes at least one photodiode. ### Claim 22 (depends on 19) The sampling system of claim 19 wherein the angle at which the emitters emit is selectively adjustable. ### Claim 23 (depends on 19) The sampling system of claim 19 wherein the emitters are pivotally mounted for rotation together with respect to the interior of the tubular structure to selectively adjust the angle at which the emitters emit. ### Claim 24 (depends on 19) The sampling system of claim 19 wherein a ratio of distance between the emitters and the at least one primary lateral sampling detector and a width of the interior of the tubular structure allows from one to at least 25 passes along a length of the chamber structure. ### Claim 25 (depends on 19) The sampling system of claim 19 wherein the tubular structure has a rectangular or conic cross-sectional profile perpendicular to the length thereof.