Probabilistic method and system for testing a material
AssigneeGeneral Electric Company
InventorsArun Karthi Subramaniyan, Shesh Krishna Srivatsa, Don Beeson, Liping Wang
Life of this patent
Estimating the term…
Loading patent…
AssigneeGeneral Electric Company
InventorsArun Karthi Subramaniyan, Shesh Krishna Srivatsa, Don Beeson, Liping Wang
Estimating the term…
A method implemented using a processor based device for simulation based testing of materials, includes selecting a first set of points from a data generated from a design space and generating a stochastic metamodel based on the first set of points. The method also includes determining an uncertainty value based on the stochastic metamodel. The method also includes identifying a second set of points different from the first set of points, from the data generated from the design space, based on the uncertainty value. The method further includes combining the second set of points with the first set of points to generate a third set of points, assigning the third set of points to the first set of points. The method also includes iteratively generating, determining, identifying, combining, and assigning steps till the uncertainty value is less than or equal to a predetermined threshold value.
A method for simulation based testing of materials, comprising:
A system for simulation based testing of materials, the system comprising:
A non-transitory computer readable medium encoded with a program for simulation based testing of materials, to instruct a processor based device to:
Dependencies are inferred from the claim text.