Temperature measurement device and temperature measurement method
AssigneeSeiko Epson Corporation
InventorSakiko SHIMIZU
Life of this patent
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Abstract
A temperature measurement device 100 includes: a first temperature sensor 11 and a second temperature sensor 12 that are provided at different positions in a base portion 100 that is in contact with a measurement subject; and a computation processing unit 300 configured to calculate a temperature of the measurement subject by using temperatures detected by the first temperature sensor 11 and the second temperature sensor 12.
Claims15
A temperature measurement device comprising:
- at least two temperature sensors provided at different positions in a base portion that is in contact with a measurement subject;
- and
- a computation processing unit configured to calculate a temperature of the measurement subject by using temperatures detected by the at least two temperature sensors.
A temperature measurement method for a temperature measurement device including at least two temperature sensors provided at different positions in a base portion that is in contact with a measurement subject, and a computation processing unit, the temperature measurement method comprising:
- detecting temperatures by using the at least two temperature sensors;
- and
- calculating a temperature of the measurement subject by using the temperatures detected by the at least two temperature sensors.
Dependencies are inferred from the claim text.