Non-ambipolar electric pressure plasma uniformity control
AssigneeTokyo Electron Limited
InventorsLee Chen, Zhiying Chen, Jianping Zhao, Merritt Funk
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AssigneeTokyo Electron Limited
InventorsLee Chen, Zhiying Chen, Jianping Zhao, Merritt Funk
Estimating the term…
This disclosure relates to a plasma processing system for controlling plasma density near the edge or perimeter of a substrate that is being processed. The plasma processing system may include a plasma chamber that can receive and process the substrate using plasma for etching the substrate, doping the substrate, or depositing a film on the substrate. This disclosure relates to a plasma processing system that may be configured to enable non-ambipolar diffusion to counter ion loss to the chamber wall. The plasma processing system may include a ring cavity coupled to the plasma processing system that is in fluid communication with plasma generated in the plasma processing system. The ring cavity may be coupled to a power source to form plasma that may diffuse ions into the plasma processing system to minimize the impact of ion loss to the chamber wall.
An apparatus for treating a substrate, comprising:
A method for treating a substrate, comprising:
The method of claim 13, wherein the second plasma comprises a second plasma density profile that is different from the first density profile.
An apparatus for treating a substrate, comprising:
Dependencies are inferred from the claim text.