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US 2014/0273313 A1Published application
Method and apparatus providing inline photoluminescence analysis of a photovoltaic device
AssigneeFirst Solar, Inc.
InventorsNavneet Kumar, Amir Weiss
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Abstract
A method and apparatus are disclosed which use a photoluminescent light intensity signature to characterize a processed photovoltaic substrate.
Claims32
A method of determining a processing characteristic of photovoltaic device fabrication, the method comprising:
- receiving a substrate which has a chloride treated absorber layer thereon;
- further processing the substrate having the chloride treated absorber layer;
- illuminating the processed substrate with light of a predetermined wavelength;
- determining the intensity of photoluminescent light produced by the processed substrate;
- and
- forming a photoluminescent light intensity signature based on the intensity of the photoluminescent light.
3 more elements
A method of inspecting a completed photovoltaic device, the method comprising:
- receiving a completed photovoltaic device from an assembly line;
- illuminating the photovoltaic device through a light receiving surface with light of a predetermined wavelength;
- determining the intensity of photoluminescent light produced by the photovoltaic device;
- forming a photoluminescent light intensity signature for the photovoltaic device.
1 more element
Dependencies are inferred from the claim text.