Resist composition, method of forming resist pattern, polymeric compound and compound
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsDaichi Takaki, Yoshiyuki Utsumi
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AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsDaichi Takaki, Yoshiyuki Utsumi
Estimating the term…
A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, including a base component (A) which exhibits changed solubility in a developing solution under action of acid, the base component (A) including a polymeric compound (A1) containing a structural unit (a0) represented by general formula (a0-1) shown below. In the formula, W1 represents a group which is formed by polymerization reaction of a group containing a polymerizable group; Y1 and Y2 each independently represents a divalent linking group; Y3 represents a carbonyl group or an alkylene group; R2 and R3 each independently represents a fluorine atom or a fluorinated alkyl group; Mm+ represents an organic cation having a valency of m; and m represents an integer of 1 or more.
A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution by the action of acid, comprising:
A polymeric compound comprising a structural unit (a0) represented by general formula (a0-1) shown below:
A compound represented by general formula (a0-m1) shown below:
Dependencies are inferred from the claim text.