Test Architecture for Characterizing Interconnects in Stacked Designs
AssigneeMentor Graphics Corporation
InventorsWu-Tung Cheng, Ruifeng Guo, Yu Huang, Liyang Lai, Jing YE, Yu HU
Life of this patent
Estimating the term…
Abstract
Aspects of the invention relate to ring-oscillator-based test architecture for characterizing interconnects in stacked designs. The disclosed ring-oscillator-based test architecture comprises a plurality of boundary scan cells coupled to a plurality of interconnects. Each of the plurality of boundary scan cells can be configured to operate as, based on control signals, a conventional boundary scan cell or any bit of an asynchronous counter. The control signals are supplied by control circuitry.
Claims10
An integrated circuit to be fabricated on a first die, comprising:
- a plurality of interconnection elements for communicating with another integrated circuit to be fabricated on a second die, the second die being adjacent to the first die when the first die and the second die are stacked or being mounted on a same substrate as the first die;
- a plurality of boundary scan cells coupled to the plurality of interconnection elements, wherein each of the plurality of boundary scan cells can be configured to operate as, based on control signals, a conventional boundary scan cell or any bit of an asynchronous counter;
- and
- control circuitry that supplies the control signals.
One or more non-transitory processor-readable media storing processor-executable instructions for causing one or more processors to create a design of an integrated circuit to be fabricated on a first die, the integrated circuit comprising:
- a plurality of interconnection elements for communicating with another integrated circuit to be fabricated on a second die, the second die being adjacent to the first die when the first die and the second die are stacked or being mounted on a same substrate as the first die;
- a plurality of boundary scan cells coupled to the plurality of interconnection elements, wherein each of the plurality of boundary scan cells can be configured to operate as, based on control signals, a conventional boundary scan cell or any bit of an asynchronous counter;
- and
- control circuitry that supplies the control signals.
Dependencies are inferred from the claim text.