Method and Apparatus for Determining Tunable Parameters to Use in Power and Performance Management
AssigneeApple Inc.
InventorsErik P. Machnicki, Brian P. Lilly, Gurjeet S. Saund, Sukalpa Biswas
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AssigneeApple Inc.
InventorsErik P. Machnicki, Brian P. Lilly, Gurjeet S. Saund, Sukalpa Biswas
Estimating the term…
Various method and apparatus embodiments for selecting tunable operating parameters in an integrated circuit (IC) are disclosed. In one embodiment, an IC includes a number of various functional blocks each having a local management circuit. The IC also includes a global management unit coupled to each of the functional blocks having a local management circuit. The management unit is configured to determine the operational state of the IC based on the respective operating states of each of the functional blocks. Responsive to determining the operational state of the IC, the management unit may provide indications of the same to the local management circuit of each of the functional blocks. The local management circuit for each of the functional blocks may select one or more tunable parameters based on the operational state determined by the management unit.
An integrated circuit comprising:
A method comprising:
An integrated circuit comprising:
A method comprising:
An integrated circuit comprising:
Dependencies are inferred from the claim text.