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US 2014/0236512 A1Published application
Planar structure characteristics obtained with look up tables
AssigneeHewlett-Packard Development Company, L.P.
InventorJohn Yan
Life of this patent
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Abstract
A system including a computing device to compare a first measured characteristic of a planar structure to a first look up table and obtain the relative permittivity of the planar structure based on the comparison of the first measured characteristic. The computing device compares a second measured characteristic of the planar structure to a second look up table to obtain the tangential loss of the planar structure based on the comparison of the second measured characteristic.
Claims20
A system comprising:
- a computing device to compare a first measured characteristic of a planar structure to a first look up table and obtain relative permittivity of the planar structure based on the comparison of the first measured characteristic, and to compare a second measured characteristic of the planar structure to a second look up table and obtain tangential loss of the planar structure based on the comparison of the second measured characteristic.
A system comprising:
- a measurement device to measure phase delay per unit length of at least one waveguide in a planar structure and insertion loss per unit length of the at least one waveguide in the planar structure;
- and
- a computing device to compare the phase delay per unit length to a phase delay look up table and obtain relative permittivity of the planar structure based on the comparison of the phase delay per unit length, and to compare the insertion loss per unit length to an insertion loss look up table and obtain tangential loss of the planar structure based on the comparison of the insertion loss per unit length.
A method comprising:
- comparing a first measured characteristic of a planar structure to a first look up table via a computing device;
- obtaining relative permittivity of the planar structure from the first look up table based on the comparison of the first measured characteristic;
- comparing a second measured characteristic of the planar structure to a second look up table via the computing device;
- and
- obtaining tangential loss of the planar structure from the second look up table based on the comparison of the second measured characteristic.
2 more elements
Dependencies are inferred from the claim text.