Sizing of a defect using phased array system
AssigneeOlympus NDT
InventorsMartin St-Laurent, Jinchi Zhang
Life of this patent
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Abstract
Disclosed is an improved method of sizing a defect using a phased array system with a single probe orientation requiring only a simple one-pass scan. It is an improvement of the ADDT standard which is adapted to phased array systems with fixed probe orientations. Based on pre-configured parameters obtained from C-scans, the method as presently disclosed provides novel analysis on C-scans and more complete information on defects, including the orientation and sizes in length and depth or thickness of the defects. Phased array systems devised with the presently disclosed method can perform such inspection and complete sizing automatically for longitudinal, transverse and oblique defects in one pass of scan.
Claims20
An ultrasonic phased array inspection system configured to scan a test surface of a test object for a possible unknown defect and to determine the size, orientation and location of the defect within the test object once the defect is found, wherein the size of the defect includes a length, width and depth of the defect, the system comprising,
- a phased array probe with an acquisition unit configured to emit ultrasonic energy into the test object while scanning the test object, receive echo signals and to convert the echo signals into electronic signals;
- a signal processing circuit configured to produce at least one C-scan based on the electronic signals pertaining to the defect;
- a signal analyzer configured to:
- produce the length and orientation of the defect based on the C-scan related to the echo signals pertaining to the defect,
- calculate the maximum amplitude and its associated maximum point of the C-scan pertaining to the defect, and
- to calculate the size of depth of the defect based the orientation of the defect and the maximum amplitude.
A method of determining the size, orientation and location of a found defect within a test object by using an ultrasonic phased array inspection system configured to scan a test surface of the test object, wherein the size of the defect includes a length, width and depth of the defect,
- the method comprising the steps of,
- employing a phased array probe configured to emit ultrasonic energy into the test object while scanning the test object, receive echo signals and to convert the echo signals into electronic signals;
- obtaining at least one C-scan produced by a signal processing circuit, the C-scan is based on the electronic signals pertaining to the defect;
- producing the length and orientation of the defect based on the C-scan related to the echo signals pertaining to the defect,
- calculating the maximum amplitude and its associated maximum point of the C-scan pertaining to the defect,
- determining a sectioning line associated with the maximum point and a C-scan slice along the sectioning line and the orientation of the defect,
- producing two time-of-flights at two half-amplitude-points presenting half of the maximum amplitude, and
- calculating the size of depth of the defect based on the two time-of-flights and the maximum amplitude.
Dependencies are inferred from the claim text.