Method of using neutrilized dna (n-dna) as surface probe for high throughput detection platform
AssigneeNational Central University
InventorsWen-Yi Chen, Yun-Shyong Yang, Hardy Wai-Hong Chan
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Abstract
A method of using Neutrilized DNA (N-DNA) as a surface probe for a high throughput detection platform is disclosed. FET and SPRi are used as high throughput detection platforms to demonstrate that the N-DNA surface probe produces good results and enhances detection sensitivity. The N-DNA modifies the charged oxygen ions (O−) on the phosphate backbone through methylation, ethylation, propylation, or alkylation, so that the backbone is not charged after this modification to increase the hybridization efficiency, sensitivity and to make the signal more clear.
Claims8
An Neutrilized DNA (N-DNA) surface probe used in a high throughput detection platform, wherein the N-DNA modifies the charged oxygen ions (O−) on the phosphate backbone of said N-DNA through methylation, ethylation, propylation, or alkylation, so that the backbone is not charged after this modification to increase the hybridization efficiency, sensitivity and to make the signal more clear.
A method of utilizing N-DNA surface probe in a high throughput detection platform comprises a chip modification step and a fluid detection step.
Dependencies are inferred from the claim text.