MCM-56 Manufacture
AssigneeExxonMobil Chemical Company - Law Technology
InventorsIvy D. Johnson, Nadya Ann Hrycenko, Wieslaw J. Roth, Terry E. Helton
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Abstract
The present invention provides an improved method for manufacturing high quality porous crystalline MCM-56 material. It also relates to the MCM-56 material manufactured by the improved method, catalyst compositions comprising same and use thereof in a process for catalytic conversion of hydrocarbon compounds. One such conversion process involves production of monoalkylated aromatic compounds, particularly ethylbenzene and cumene, by the liquid or partial liquid phase alkylation of alkylatable aromatic compound, particularly benzene.
Claims16
A method for manufacturing synthetic porous crystalline MCM-56 material comprising the steps of:
- a) preparing a first reaction mixture containing sources of alkali or alkaline earth metal (M) cation, an oxide of a trivalent element X, an oxide of a tetravalent element Y, zeolite seed crystals, and water, said first reaction mixture having a composition in terms of mole ratios of oxides within the following ranges:
- YO2/X2O3=5 to 35;
- H2O/YO2=10 to 70;
- OH−/YO2=0.05 to 0.20;
- M/YO2=0.05 to 3.0;
- said first reaction mixture further comprising zeolite seed crystals in an amount from greater than or equal to 0.05 wt. % to less than or equal to 5 wt. %, based on the weight of said first reaction mixture;
- b) adding directing agent R to the reaction mixture of step a) to form a second reaction mixture, having said directing agent R in terms of a mole ratio within the following range:
- R/YO2=0.08 to 0.3;
- and
- c) crystallizing said second reaction mixture of step b) under conditions of temperature of from about 90° C. to about 175° C. and a time for less than 90 hours to form a resulting mixture comprising crystals of said MCM-56 material and less than 10 wt. % non-MCM-56 impurity crystals based on the total weight of said MCM-56 crystals in said second reaction mixture, as identified by X-ray diffraction,
- wherein said crystals of said MCM-56 material have an X-ray diffraction pattern as shown in Table 1:
- TABLE 1
- Interplanar d-Spacing
- (Angstroms)
- Relative Intensity
- 12.4 ± 0.2
- vs
- 9.9 ± 0.3
- m
- 6.9 ± 0.1
- w
- 6.4 ± 0.3
- w
- 6.2 ± 0.1
- w
- 3.57 ± 0.07
- m-s
- 3.44 ± 0.07
- vs
-25. (canceled)
Dependencies are inferred from the claim text.