Test chip
AssigneeBrother Kogyo Kabushiki Kaisha
InventorsYumiko OSHIKA, Chisato YOSHIMURA, Chie NAKASHIMA
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AssigneeBrother Kogyo Kabushiki Kaisha
InventorsYumiko OSHIKA, Chisato YOSHIMURA, Chie NAKASHIMA
Estimating the term…
A test chip includes a substrate, a lid member, a separation portion, a first flow path, and a first holding portion. The substrate includes a surface on which a flow path is formed. The lid member covers the surface of the substrate. By centrifugal force, the separation portion separates components of a test object liquid into a separated component and a residual component having a larger specific gravity than a specific gravity of the separated component. The first flow path guides the separated component from the separation portion to a receiving portion. The first holding portion holds at least part of the residual component overflowing from the separation portion in a case where the separated component separated in the separation portion is moved from the separation portion to the receiving portion. The first holding portion is connected to at least one of the separation portion and the first flow path.
A test chip comprising:
A test chip including a substrate and a cover portion, the substrate including a surface on which a flow path is formed, the cover portion being configured to cover the surface of the substrate, the test chip comprising:
A chip including a substrate and a cover portion, the substrate including a surface on which a passage is formed, the cover portion being configured to cover the surface of the substrate, the chip comprising:
Dependencies are inferred from the claim text.