Systems, devices and methods for the quality assessment of oled stack films

An apparatus, comprising:

• a camera to capture image data encompassing a layer deposited within pixel well on a substrate;
• at least one processor;
• and
• a computer-readable medium operably coupled to the processor, the computer-readable medium having computer-readable instructions stored thereon that, when executed by the at least one processor, cause the apparatus to
• receive the image data from the camera,
• filter the image data to obtain filtered data representing the deposited layer within the pixel well,
• apply a gradient function to at least one of the received data or the filtered data to obtain processed data, and
• generate an output indicating whether deposited layer satisfies at least one threshold representing a minimum quality criterion, dependent on the processed data.

A method of determining whether a layer of material deposited within a pixel well of a display panel meets a predetermined quality criterion, the method comprising:

• receiving a captured image of the layer;
• filtering the captured image to obtain filtered data representing the deposited layer;
• applying a gradient function to at least one of the received data or the filtered data to obtain processed data;
• and
• generating, dependent on the processed data, an output that indicates whether the deposited layer within the well meets the predetermined quality criterion.

An apparatus, comprising:

• storage to receive a captured image of a layer of material deposited within a pixel well of a display panel;
• means for filtering the captured image to obtain filtered data representing the layer;
• means for applying a gradient function to at least one of the received data or the filtered data to obtain processed data;
• and
• means for generating an output, dependent on the processed data, which indicates whether the deposited layer satisfies at least one threshold representing a minimum quality criterion.