Phase imaging
AssigneeUCL Business PLC
InventorsPeter Munro, Alessandro Olivo, Konstantin Ignatyev, Robert Speller
Life of this patent
Estimating the term…
Abstract
A method of phase imaging uses X-ray beams having edges overlapping with pixels. A phase image may be obtained from first and second images using one or more X-ray beam, the first image being measured with the first edge but not the second edge of each X-ray beam overlapping the corresponding pixel(s) and the second image being measured with the second edge but not the first edge overlapping the corresponding pixel(s). The gradient of the X-ray absorption function may be calculated and a proportional term included in the image processing to calculate a quantitative phase image.
Claims15
A method of phase imaging, comprising:
- providing a source (2) of X-rays;
- directing the source (2) of X-rays to define at least one X-ray beam with opposed first and second edges;
- passing the at least one X-ray beam through a sample region of a sample onto an X-ray detector having pixels or rows of pixels corresponding to the at least one X-ray beam;
- obtaining a first image in a first configuration wherein the at least one X-ray beam includes at least one first X-ray beam where the first edge but not the second edge of each first X-ray beam overlaps the corresponding pixel or row of pixels in the X-ray detector and
- obtaining a second image in a second configuration wherein the at least one X-ray beam includes at least one second X-ray beam where the second edge but not the first edge of each second X-ray beam overlaps the corresponding pixel or row of pixels in the X-ray detector to obtain a second X-ray image;
- and
- obtaining a phase image from the first and second X-ray images by taking the difference between the first and second X-ray images.
A method of phase imaging, comprising:
- providing a source (2) of X-rays;
- directing the source (2) of X-rays to define at least one X-ray beam with opposed first and second edges;
- passing the at least one X-ray beam through a sample region of a sample onto an X-ray detector having pixels or rows of pixels corresponding to the at least one X-ray beam;
- measuring in a first configuration where the first edge but not the second edge of each X-ray beam overlaps the corresponding pixel or row of pixels in the X-ray detector to obtain a first X-ray image;
- and
- obtaining a phase image by:
- calculating the gradient of the X-ray absorption function and
- combining the first X-ray image with a term proportional to the gradient of the absorption function to calculate a quantitative phase image.
Dependencies are inferred from the claim text.