Method and apparatus for self-testing to improve factory throughput
AssigneeQUALCOMM Incorporated
InventorsSudarsan KRISHNAN, Andrei V. IZOTOV
Life of this patent
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AssigneeQUALCOMM Incorporated
InventorsSudarsan KRISHNAN, Andrei V. IZOTOV
Estimating the term…
A method and apparatus for self-testing of a radio frequency (RF) chipset is provided. The method requires that a set of test instructions be loaded into a software load station. Once the software is loaded, reference calibration is conducted with test equipment connected. After calibration, the test equipment is disconnected and self-testing of a transmit chain begins. A pre-determined load value is connected and the self-testing process routes a signal from the RF chipset internal modem through a power amplifier, duplexer, first coupler, switch, second coupler, and RF integrated circuit (IC). The apparatus includes a RF chipset that has an internal modem and signal generator as well as processors for processing self-testing of a transmit chain, self-testing of a primary receiver, and self-testing of a diversity receiver chain.
A method for self-testing a radio frequency (RF) chipset, comprising:
An apparatus for self-testing a radio frequency (RF) chipset, comprising:
An apparatus for self-testing a radio frequency (RF) chipset, comprising:
A non-transitory computer readable medium containing instructions, which when executed by a processor cause the processor to perform the following steps:
Dependencies are inferred from the claim text.