Multi-purpose integrated circuit device contactor

A tester apparatus comprising:

• a first printed circuit board;
• wherein in a first configuration a pogo block assembly including a plurality of pogo blocks and a first frame, is configured to be electrically connected to the first printed circuit board and to receive a packaged integrated circuit under test;
• and
• wherein in a second configuration the plurality of pogo blocks are coupled to a second frame, thinner then the first frame, and electrically connected to the first printed circuit board and electrically connected to a second printed circuit board.

A method of configuring a tester comprising:

• configuring the tester in a first or a second configuration, wherein
• configuring the tester in the first configuration includes,
• securing a pogo block to a first frame and an alignment plate to form a first contactor assembly, the alignment plate to align a packaged integrated circuit under test;
• and
• electrically connecting the pogo block to a first printed circuit board;
• wherein configuring the tester in a second configuration includes, securing the pogo block to a second frame thinner than the first frame;
• electrically coupling the first printed circuit board to one side of the pogo block and electrically connecting a second printed circuit board to another side of the pogo block;
• and
• coupling a contactor assembly including another pogo block, frame, and alignment plate to the second printed circuit board.