Slide Scanner with a Tilted Image
AssigneeHuron Technologies International Inc.
InventorsSavvas Damaskinos, Arthur Edward Dixon
Life of this patent
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Abstract
An instrument and method for scanning a large microscope specimen uses a light source and at least one lens to focus light from the specimen onto a detector array. The specimen holder is located on a scanning stage and the detector array is dynamically tilted about a scan direction during the scan to maintain focus across the width of the scan strip as the scan proceeds. A degree of tilt varies during the scan as is required to maintain lateral focus relative to the detector array.
Claims22
An instrument for scanning a large microscope specimen on a specimen holder, the instrument comprising a light source and at least one lens that focuses light from the specimen onto a detector array, the specimen holder being located on a scanning stage, the detector array being dynamically tilted about a scan direction during a scan to maintain focus across a width of a scan strip as the scan proceeds, the instrument having means to focus axially.
A method of scanning a large microscope specimen on a specimen holder using an instrument comprising a light source and at least one lens that focuses light from the specimen onto a detector array, the specimen holder being located on a scanning stage, the method comprising dynamically tilting the detector array about a scan direction during a scan to maintain focus relative to the specimen across a width of a scan strip as the scan proceeds, while focusing the instrument relative to the specimen axially.
Dependencies are inferred from the claim text.