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US 2014/0229784 A1Published application
Dynamic hard error detection
AssigneeInternational Business Machines Corporation
InventorsPradip Bose, Alan Gara, Hans M. Jacobson
Life of this patent
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Abstract
A method of testing a circuit includes halting a flow of normal data through the circuit, running test data through the circuit while subjecting the circuit to a stress condition, and determining whether a hard error exists in the circuit based on the running of the test data.
Claims9
A method of testing a circuit, comprising:
- halting a flow of normal data through the circuit;
- running test data through the circuit while subjecting the circuit to a stress condition;
- and
- determining whether a hard error exists in the circuit based on the running of the test data.
1 more element
Dependencies are inferred from the claim text.